A Calibration Method of Double Line Structured Light for Skin Seam Measurement
LU Xiaoxiang1, HUANG Xiang1, LI Gen2, ZHAO Ziyue3, MENG Yayun1
1. College of Mechanical and Electrical Engineering, Nanjing University of Aeronautics and Astronautics, Nanjing 210016, China;
2. Suzhou Research Institute of Nanjing University of Aeronautics and Astronautics, Suzhou 215000, China;
3. AVIC Beijing Changcheng Institute of Metrology & Measurement, Beijing 100095, China
Aiming at the requirement of high-precision calibration of light plane for double-line structured light skin seam measurement system, a calibration method of two-line structured light plane based on planar target is proposed. First, take the datum point on the target plane as input, construct the target plane pose solution model, and obtain its plane equation in the camera coordinate system. Then, according to the line surface model of the camera, the depth of the fitting control points is reconstructed. Finally, the eigenvalue method is used to fit the denoised fitting control point set to complete the calibration of double-line structured light plane. Experiments show that this method can simultaneously complete the calibration of two light planes in the measurement system. After calibration, the repeated measurement accuracy of seam gap is better than 0.050 mm, and the repeated measurement accuracy of seam flush is better than 0.030 mm.
基金资助:国防基础科研计划（JCKY2018205B005）。
引用本文:
鲁小翔，黄翔，李根，赵子越，孟亚云. 一种面向蒙皮对缝测量的双线结构光标定方法[J]. 航空制造技术, 2023, 66(20): 100-108.
LU Xiaoxiang, HUANG Xiang, LI Gen，ZHAO Ziyue, MENG Yayun. A Calibration Method of Double Line Structured Light for Skin Seam Measurement[J]. Aeronautical Manufacturing Technology, 2023, 66(20): 100-108.
2023, 
